Kenya Industrial Estates (KIE) is delighted to share its successful participation in the Kenya Association of Manufacturers (KAM) Event, held at the Kenyatta International Convention Centre (KICC) in Nairobi from October 31st to November 4th, 2022. The event, organized by the Kenya National Chamber of Commerce & Industry (KNCCI) in collaboration with the Ministry of Industrialization, Saccos, and other strategic partners, served as a dynamic platform for SMEs to showcase their products and services.
KIE actively engaged with SMEs during the event, underscoring its commitment to supporting and nurturing Kenya’s vibrant small and medium-sized enterprises. This participation allowed KIE to not only showcase its services but also foster valuable connections with SMEs and industry stakeholders.
Throughout the KAM Event, KIE was prominently featured in photos and press appearances, highlighting its active presence and participation in various activities, including panel discussions and networking sessions. This engagement not only increased KIE’s brand recognition but also contributed significantly to the advancement of the SME sector in Kenya.
The objectives of KIE’s participation in the KAM Event were resoundingly achieved, with increased brand visibility, productive interactions with SMEs, and meaningful contributions to discussions on sector growth and development. KIE remains committed to its mission of driving industrialization and economic growth in Kenya, and events like these underscore its dedication to fostering local talent and industries.
In conclusion, KIE’s participation in the Kenya Association of Manufacturers Event at KICC Nairobi was a resounding success. The organization achieved its objectives of enhancing brand visibility, engaging with SMEs, and contributing to the growth and development of the SME sector. This event not only bolstered KIE’s brand recognition but also forged invaluable connections with SMEs and industry stakeholders, reaffirming its commitment to Kenya’s industrialization journey.
